22-26 May 2018
Faculty of Radio Physics, Electronics and Computer Systems
Europe/Kiev timezone

THE VOLTAGE OSCILLATIONS IN THE SILICON STRUCTURE AT COURSE OF EXTREME CURRENTS

Not scheduled
15m
Faculty of Radio Physics, Electronics and Computer Systems

Faculty of Radio Physics, Electronics and Computer Systems

Faculty of Radio Physics, Electronics and Computer Systems of Taras Shevchenko National University of Kyiv, acad. Glushkov ave., 4g, Kyiv, Ukraine
Oral Physics of Semiconductors and Dielectrics, Semiconductor’s Devices

Speaker

Gandzyuk (Taras Shevchenko National University of Kyiv)

Description

Voltage oscillations that arise when high-density currents flow through silicon with dielectric isolation (SDI) structure have been obtained and investigated. The investigations have been conducted in pulsed mode. Volt-ampere characteristics of SDI structure and distinctive parameters of oscillograms for both relaxation and quasi-harmonic oscillations have been studied. We have proposed a model to show how the voltage oscillations have been arising.

Primary authors

Mr S Pavlyuk (Taras Shevchenko National University of Kyiv) Prof. Valerii Grygoruk Volodymyr Telega Mr Petrychuk (Taras Shevchenko National University of Kyiv) Mr Ivanchuk (Taras Shevchenko National University of Kyiv) Gandzyuk (Taras Shevchenko National University of Kyiv)

Presentation Materials

There are no materials yet.