Speaker
Mr
Ye Vakylyak
Description
The silicon structures with dielectric insulation are having voltage fluctuations under single powerful current pulses. It is shown that the heating of the structure reaches such values that there is a negative differential conductivity in the overheating mechanism, which leads to the occurrence of voltage fluctuations.
Primary authors
Mr
S Pavlyuk
(Taras Shevchenko National University of Kyiv)
Prof.
Valerii Grygoruk
Mrs
l Ischuk
(Taras Shevchenko National University of Kyiv)
Volodymyr Telega
Mr
V Kovtok
(Taras Shevchenko National University of Kyiv)
Mr
Ye Vakylyak